A1688 isHall-effect integrated circuits(IC) provides a user-friendly solution for true zero-speed digital ring magnet and gear tooth sensing in two-wire applications. The A1688 is available in a UB package that integrates an IC and a high temperature ceramic capacitor in a single molded SIP package. This integrated capacitor not only provides higher EMC performance, but also reduces external component count.
The integrated circuit combines a two-element Hall-effect circuit with signal processing to switch in response to a differential magnetic signal generated by a magnetic encoder or, if the offset is properly compensated by a magnet, in response to a differential magnetic signal generated by a ferromagnetic target. The device contains complex digital circuitry that reduces the offset of the magnet and system, calibrates the gain of the air-gap-independent switchpoint, and provides true zero-speed operation.
The device optimizes the signal when it is powered back up with bias and gain adjustment, and maintains it during operation using the run-mode calibration mechanism. Run-mode calibration eliminates environmental influences such as microoscillations of the sensing target at start-up or sudden changes in air gap.
The adjustable current output is configurable for a two-wire interface circuit and is ideal for obtaining speed information in wheel speed applications. Hall element spacing is optimized for high-resolution, small-diameter targets. The package is lead (Pb) free and features 100% matte tin leadframe plating.
- Integrated capacitors reduce the number of external EMI protection components
- Wider pins facilitate assembly
- True zero-speed operation
- Automatic gain control (AGC) for air-gap-independent switchpoints
- Automatic Offset Adjustment (AOA) for optimized signal processing
- Large operating air gap range
- Internal current regulator for two-wire operation
- Undervoltage lockout
- Single-chip sensing ICs enable high reliability
- On-board voltage regulator with a wide operating voltage range and stability over a variety of complex load impedances
- Fully synchronized digital logic with scanning and IDDQ testing
//www.chip100.com/